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Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates

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Title: Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates
Authors: Sedaghat, Reza, rsedagha@ee.ryerson.ca, Kunchwar, Mayuri1, Abedi, Raha1, Javaheri, Reza1
Source: Microelectronics Reliability; Dec2006, Vol. 46 Issue 12, p2149-2158, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 22596412
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates
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  Data: <searchLink fieldCode="AU" term="%22Sedaghat%2C+Reza%22">Sedaghat, Reza</searchLink>, <i>rsedagha@ee.ryerson.ca</i><br /><searchLink fieldCode="AU" term="%22Kunchwar%2C+Mayuri%22">Kunchwar, Mayuri</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Abedi%2C+Raha%22">Abedi, Raha</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Javaheri%2C+Reza%22">Javaheri, Reza</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>; Dec2006, Vol. 46 Issue 12, p2149-2158, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=22596412
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.microrel.2005.12.005
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 2149
    Titles:
      – TitleFull: Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates
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            NameFull: Sedaghat, Reza
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            NameFull: Kunchwar, Mayuri
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            NameFull: Abedi, Raha
      – PersonEntity:
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            NameFull: Javaheri, Reza
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            – D: 01
              M: 12
              Text: Dec2006
              Type: published
              Y: 2006
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              Value: 00262714
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              Value: 46
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              Value: 12
          Titles:
            – TitleFull: Microelectronics Reliability
              Type: main
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