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Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies.

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Title: Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies.
Authors: Bozanic, A.1, Majlinger, Z.1, Petravic, M.1, mpetravic@ffri.hr, Gao, Q.2, Llewellyn, D.2, Crotti, C.3, Yang, Y.-W.4
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jul2008, Vol. 26 Issue 4, p592-596, 5p, 1 Chart, 6 Graphs
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 34360921
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies.
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  Data: <searchLink fieldCode="AU" term="%22Bozanic%2C+A%2E%22">Bozanic, A.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Majlinger%2C+Z%2E%22">Majlinger, Z.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Petravic%2C+M%2E%22">Petravic, M.</searchLink><relatesTo>1</relatesTo>, <i>mpetravic@ffri.hr</i><br /><searchLink fieldCode="AU" term="%22Gao%2C+Q%2E%22">Gao, Q.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Llewellyn%2C+D%2E%22">Llewellyn, D.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Crotti%2C+C%2E%22">Crotti, C.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Y%2E-W%2E%22">Yang, Y.-W.</searchLink><relatesTo>4</relatesTo>
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=34360921
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1116/1.2929851
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 5
        StartPage: 592
    Titles:
      – TitleFull: Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies.
        Type: main
  BibRelationships:
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      – PersonEntity:
          Name:
            NameFull: Bozanic, A.
      – PersonEntity:
          Name:
            NameFull: Majlinger, Z.
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            NameFull: Petravic, M.
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            NameFull: Gao, Q.
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            NameFull: Llewellyn, D.
      – PersonEntity:
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            NameFull: Crotti, C.
      – PersonEntity:
          Name:
            NameFull: Yang, Y.-W.
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          Dates:
            – D: 01
              M: 07
              Text: Jul2008
              Type: published
              Y: 2008
          Identifiers:
            – Type: issn-print
              Value: 07342101
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              Value: 26
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
              Type: main
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