Quenched-in defect removal through silicide formation by rapid thermal processing.

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Bibliographic Details
Title: Quenched-in defect removal through silicide formation by rapid thermal processing.
Authors: Mathiot, Daniel
Source: Applied Physics Letters; 1/14/1991, Vol. 58 Issue 2, p131, 3p, 1 Chart, 2 Graphs
Database: Applied Science & Technology Source
Description
ISSN:00036951
DOI:10.1063/1.104950