Electronic and structural properties of the amorphous/crystalline silicon interface
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| Title: | Electronic and structural properties of the amorphous/crystalline silicon interface |
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| Authors: | Kleider, J.P.1, kleider@lgep.supelec.fr, Chouffot, R.1, Gudovskikh, A.S.2, Roca i Cabarrocas, P.3, Labrune, M.3, Ribeyron, P.-J.4, Brüggemann, R.5 |
| Source: | Thin Solid Films; Oct2009, Vol. 517 Issue 23, p6386-6391, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00406090 |
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| DOI: | 10.1016/j.tsf.2009.02.092 |
