APA (7th ed.) Citation

Kleider, J., Chouffot, R., Gudovskikh, A., Roca i Cabarrocas, P., Labrune, M., Ribeyron, P., & Brüggemann, R. (2009). Electronic and structural properties of the amorphous/crystalline silicon interface. Thin Solid Films, 517(23), 6386. https://doi.org/10.1016/j.tsf.2009.02.092

Chicago Style (17th ed.) Citation

Kleider, J.P, R. Chouffot, A.S Gudovskikh, P. Roca i Cabarrocas, M. Labrune, P.-J Ribeyron, and R. Brüggemann. "Electronic and Structural Properties of the Amorphous/crystalline Silicon Interface." Thin Solid Films 517, no. 23 (2009): 6386. https://doi.org/10.1016/j.tsf.2009.02.092.

MLA (9th ed.) Citation

Kleider, J.P, et al. "Electronic and Structural Properties of the Amorphous/crystalline Silicon Interface." Thin Solid Films, vol. 517, no. 23, 2009, p. 6386, https://doi.org/10.1016/j.tsf.2009.02.092.