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Electronic and structural properties of the amorphous/crystalline silicon interface

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Title: Electronic and structural properties of the amorphous/crystalline silicon interface
Authors: Kleider, J.P.1, kleider@lgep.supelec.fr, Chouffot, R.1, Gudovskikh, A.S.2, Roca i Cabarrocas, P.3, Labrune, M.3, Ribeyron, P.-J.4, Brüggemann, R.5
Source: Thin Solid Films; Oct2009, Vol. 517 Issue 23, p6386-6391, 6p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 43766529
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Electronic and structural properties of the amorphous/crystalline silicon interface
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Kleider%2C+J%2EP%2E%22">Kleider, J.P.</searchLink><relatesTo>1</relatesTo>, <i>kleider@lgep.supelec.fr</i><br /><searchLink fieldCode="AU" term="%22Chouffot%2C+R%2E%22">Chouffot, R.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Gudovskikh%2C+A%2ES%2E%22">Gudovskikh, A.S.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Roca+i+Cabarrocas%2C+P%2E%22">Roca i Cabarrocas, P.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Labrune%2C+M%2E%22">Labrune, M.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Ribeyron%2C+P%2E-J%2E%22">Ribeyron, P.-J.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Brüggemann%2C+R%2E%22">Brüggemann, R.</searchLink><relatesTo>5</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Thin+Solid+Films%22">Thin Solid Films</searchLink>; Oct2009, Vol. 517 Issue 23, p6386-6391, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=43766529
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.tsf.2009.02.092
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 6386
    Titles:
      – TitleFull: Electronic and structural properties of the amorphous/crystalline silicon interface
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Kleider, J.P.
      – PersonEntity:
          Name:
            NameFull: Chouffot, R.
      – PersonEntity:
          Name:
            NameFull: Gudovskikh, A.S.
      – PersonEntity:
          Name:
            NameFull: Roca i Cabarrocas, P.
      – PersonEntity:
          Name:
            NameFull: Labrune, M.
      – PersonEntity:
          Name:
            NameFull: Ribeyron, P.-J.
      – PersonEntity:
          Name:
            NameFull: Brüggemann, R.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Text: Oct2009
              Type: published
              Y: 2009
          Identifiers:
            – Type: issn-print
              Value: 00406090
          Numbering:
            – Type: volume
              Value: 517
            – Type: issue
              Value: 23
          Titles:
            – TitleFull: Thin Solid Films
              Type: main
ResultId 1