Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies

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Bibliographic Details
Title: Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies
Authors: Bozanic, A.1, abozanic@ffri.hr, Majlinger, Z.1, Petravic, M.1, Gao, Q.2, Llewellyn, D.2, Crotti, C.3, Yang, Y.-W.4, Kim, K.-J.5,6, Kim, B.5,6
Source: Vacuum; Aug2009, Vol. 84 Issue 1, p37-40, 4p
Database: Applied Science & Technology Source
Description
ISSN:0042207X
DOI:10.1016/j.vacuum.2009.04.020