Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies
Saved in:
| Title: | Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies |
|---|---|
| Authors: | Bozanic, A.1, abozanic@ffri.hr, Majlinger, Z.1, Petravic, M.1, Gao, Q.2, Llewellyn, D.2, Crotti, C.3, Yang, Y.-W.4, Kim, K.-J.5,6, Kim, B.5,6 |
| Source: | Vacuum; Aug2009, Vol. 84 Issue 1, p37-40, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0042207X |
|---|---|
| DOI: | 10.1016/j.vacuum.2009.04.020 |