APA (7th ed.) Citation

Bozanic, A., Majlinger, Z., Petravic, M., Gao, Q., Llewellyn, D., Crotti, C., . . . Kim, B. (2009). Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies. Vacuum, 84(1), 37. https://doi.org/10.1016/j.vacuum.2009.04.020

Chicago Style (17th ed.) Citation

Bozanic, A., Z. Majlinger, M. Petravic, Q. Gao, D. Llewellyn, C. Crotti, Y.-W Yang, K.-J Kim, and B. Kim. "Characterisation of Molecular Nitrogen in Ion-bombarded Compound Semiconductors by Synchrotron-based Absorption and Emission Spectroscopies." Vacuum 84, no. 1 (2009): 37. https://doi.org/10.1016/j.vacuum.2009.04.020.

MLA (9th ed.) Citation

Bozanic, A., et al. "Characterisation of Molecular Nitrogen in Ion-bombarded Compound Semiconductors by Synchrotron-based Absorption and Emission Spectroscopies." Vacuum, vol. 84, no. 1, 2009, p. 37, https://doi.org/10.1016/j.vacuum.2009.04.020.