Deep level transient spectroscopy evaluation of nonexponential transients in semiconductor alloys.
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| Title: | Deep level transient spectroscopy evaluation of nonexponential transients in semiconductor alloys. |
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| Authors: | Omling, P., Samuelson, L., Grimmeiss, H. G. |
| Source: | Journal of Applied Physics; September 1983, Vol. 54, p5117-5122, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.332733 |
