Omling, P., Samuelson, L., & Grimmeiss, H. G. (1983). Deep level transient spectroscopy evaluation of nonexponential transients in semiconductor alloys. Journal of Applied Physics, 54, 5117. https://doi.org/10.1063/1.332733
Chicago Style (17th ed.) CitationOmling, P., L. Samuelson, and H. G. Grimmeiss. "Deep Level Transient Spectroscopy Evaluation of Nonexponential Transients in Semiconductor Alloys." Journal of Applied Physics 54 (1983): 5117. https://doi.org/10.1063/1.332733.
MLA (9th ed.) CitationOmling, P., et al. "Deep Level Transient Spectroscopy Evaluation of Nonexponential Transients in Semiconductor Alloys." Journal of Applied Physics, vol. 54, 1983, p. 5117, https://doi.org/10.1063/1.332733.
Warning: These citations may not always be 100% accurate.