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Deep level transient spectroscopy evaluation of nonexponential transients in semiconductor alloys.

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Bibliographic Details
Title: Deep level transient spectroscopy evaluation of nonexponential transients in semiconductor alloys.
Authors: Omling, P., Samuelson, L., Grimmeiss, H. G.
Source: Journal of Applied Physics; September 1983, Vol. 54, p5117-5122, 6p
Database: Applied Science & Technology Source
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