Degradation and subsequent healing by electromigration in Al-1 wt % Si thin films.
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| Title: | Degradation and subsequent healing by electromigration in Al-1 wt % Si thin films. |
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| Authors: | Li, Z., Bauer, C. L., Mahajan, S. |
| Source: | Journal of Applied Physics; September 1 1992, Vol. 72, p1821-1832, 12p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.351653 |
