APA (7th ed.) Citation

Li, Z., Bauer, C. L., & Mahajan, S. (1992). Degradation and subsequent healing by electromigration in Al-1 wt % Si thin films. Journal of Applied Physics, 72, 1821. https://doi.org/10.1063/1.351653

Chicago Style (17th ed.) Citation

Li, Z., C. L. Bauer, and S. Mahajan. "Degradation and Subsequent Healing by Electromigration in Al-1 Wt % Si Thin Films." Journal of Applied Physics 72 (1992): 1821. https://doi.org/10.1063/1.351653.

MLA (9th ed.) Citation

Li, Z., et al. "Degradation and Subsequent Healing by Electromigration in Al-1 Wt % Si Thin Films." Journal of Applied Physics, vol. 72, 1992, p. 1821, https://doi.org/10.1063/1.351653.