Dopant diffusion in silicon: a consistent view involving nonequilibrium defects.

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Bibliographic Details
Title: Dopant diffusion in silicon: a consistent view involving nonequilibrium defects.
Authors: Mathiot, D., Pfister, J. C.
Source: Journal of Applied Physics; May 15 1984, Vol. 55, p3518-3530, 13p
Database: Applied Science & Technology Source
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