Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits.

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Bibliographic Details
Title: Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits.
Authors: Menon, S. M., Jayasumana, A. P., Malaiya, Y. K.
Source: IEE Proceedings. Part E, Computers & Digital Techniques.; July 1993, Vol. 140, p220-226, 7p
Database: Applied Science & Technology Source
Description
ISSN:01437062