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Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits.

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Title: Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits.
Authors: Menon, S. M., Jayasumana, A. P., Malaiya, Y. K.
Source: IEE Proceedings. Part E, Computers & Digital Techniques.; July 1993, Vol. 140, p220-226, 7p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500141845
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits.
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 7
        StartPage: 220
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      – TitleFull: Modelling and analysis of bridging faults in emitter-coupled logic (ECL) circuits.
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            NameFull: Menon, S. M.
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            NameFull: Jayasumana, A. P.
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            NameFull: Malaiya, Y. K.
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            – D: 01
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              Text: July 1993
              Type: published
              Y: 1993
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              Value: 140
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            – TitleFull: IEE Proceedings. Part E, Computers & Digital Techniques.
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