Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements.
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| Title: | Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements. |
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| Authors: | Goren, D., Nemirovsky, Y. |
| Source: | Journal of Applied Physics; January 1 1995, Vol. 77, p244-251, 8p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.359384 |
