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Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements.

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Title: Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements.
Authors: Goren, D., Nemirovsky, Y.
Source: Journal of Applied Physics; January 1 1995, Vol. 77, p244-251, 8p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500228388
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements.
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  Data: <searchLink fieldCode="AU" term="%22Goren%2C+D%2E%22">Goren, D.</searchLink><br /><searchLink fieldCode="AU" term="%22Nemirovsky%2C+Y%2E%22">Nemirovsky, Y.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; January 1 1995, Vol. 77, p244-251, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500228388
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/1.359384
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 244
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      – TitleFull: Determination of interface properties between a depleted heteroepitaxial layer and a substrate from capacitance measurements.
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            NameFull: Goren, D.
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            NameFull: Nemirovsky, Y.
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          Dates:
            – D: 01
              M: 01
              Text: January 1 1995
              Type: published
              Y: 1995
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              Value: 00218979
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              Value: 77
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            – TitleFull: Journal of Applied Physics
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