The measurement and uncertainty of a calibration standard for the scanning electron microscope.
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| Title: | The measurement and uncertainty of a calibration standard for the scanning electron microscope. |
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| Authors: | Fu, J., Croarkin, M. C., Vorburger, T. V. |
| Source: | Journal of Research of the National Institute of Standards & Technology; March/April 1994, Vol. 99, p191-199, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 1044677X |
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