Built-in self-test for digital integrated circuits.
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| Title: | Built-in self-test for digital integrated circuits. |
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| Authors: | Agrawal, Vishwani D., Lin, Chih-Jen, Rutkowski, Paul W. |
| Source: | AT&T Technical Journal; March/April 1994, Vol. 73, p30-39, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 87562324 |
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