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Built-in self-test for digital integrated circuits.

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Bibliographic Details
Title: Built-in self-test for digital integrated circuits.
Authors: Agrawal, Vishwani D., Lin, Chih-Jen, Rutkowski, Paul W.
Source: AT&T Technical Journal; March/April 1994, Vol. 73, p30-39, 10p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 500234052
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PubType: Academic Journal
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        Text: English
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      – TitleFull: Built-in self-test for digital integrated circuits.
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            NameFull: Agrawal, Vishwani D.
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            NameFull: Lin, Chih-Jen
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              Text: March/April 1994
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              Y: 1994
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