1/f noise and electromigration in multilayered via structures.
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| Title: | 1/f noise and electromigration in multilayered via structures. |
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| Authors: | Çelik-Butler, Z., Zhang, R., Patel, N. |
| Source: | Solid-State Electronics; February 1996, Vol. 39, p281-286, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00381101 |
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| DOI: | 10.1016/0038-1101(95)00127-1 |
