Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.
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| Title: | Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. |
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| Authors: | Menon, Sankaran M., Malaiya, Yashwant K., Jayasumana, Anura P. |
| Source: | IEEE Journal of Solid-State Circuits; August 1995, Vol. 30, p855-863, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00189200 |
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| DOI: | 10.1109/4.400427 |
