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Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.

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Bibliographic Details
Title: Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.
Authors: Menon, Sankaran M., Malaiya, Yashwant K., Jayasumana, Anura P.
Source: IEEE Journal of Solid-State Circuits; August 1995, Vol. 30, p855-863, 9p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500313133
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.
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  Data: <searchLink fieldCode="AU" term="%22Menon%2C+Sankaran+M%2E%22">Menon, Sankaran M.</searchLink><br /><searchLink fieldCode="AU" term="%22Malaiya%2C+Yashwant+K%2E%22">Malaiya, Yashwant K.</searchLink><br /><searchLink fieldCode="AU" term="%22Jayasumana%2C+Anura+P%2E%22">Jayasumana, Anura P.</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Journal+of+Solid-State+Circuits%22">IEEE Journal of Solid-State Circuits</searchLink>; August 1995, Vol. 30, p855-863, 9p
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/4.400427
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 9
        StartPage: 855
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      – TitleFull: Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.
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            NameFull: Menon, Sankaran M.
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            NameFull: Malaiya, Yashwant K.
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            NameFull: Jayasumana, Anura P.
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            – D: 01
              M: 08
              Text: August 1995
              Type: published
              Y: 1995
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              Value: 30
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            – TitleFull: IEEE Journal of Solid-State Circuits
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