Interface properties of metal-oxide-semiconductor structures on n-type 6H and 4H-SiC.
Saved in:
| Title: | Interface properties of metal-oxide-semiconductor structures on n-type 6H and 4H-SiC. |
|---|---|
| Authors: | Friedrichs, P., Burte, E. P., Schörner, R. |
| Source: | Journal of Applied Physics; May 15 1996, Vol. 79, p7814-7819, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
|---|---|
| DOI: | 10.1063/1.362389 |
