Schottky barrier height dependence on the silicon interlayer thickness of Au/Si/n-GaAs contacts: chemistry of interface formation study.
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| Title: | Schottky barrier height dependence on the silicon interlayer thickness of Au/Si/n-GaAs contacts: chemistry of interface formation study. |
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| Authors: | Ivančo, J., Almeida, J., Coluzza, C. |
| Source: | Vacuum; July-August 1998, Vol. 50 Issue 3-4, p407-411, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 0042207X |
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| DOI: | 10.1016/S0042-207X(98)00074-8 |
