Properties of interface states at Ta2O5/n-Si interfaces.
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| Title: | Properties of interface states at Ta2O5/n-Si interfaces. |
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| Authors: | Zhang, S. K., Fu, Z. W., Ke, L. |
| Source: | Journal of Applied Physics; July 1 1998, Vol. 84 Issue 1, p335-338, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.368032 |
