Properties of interface states at Ta2O5/n-Si interfaces.
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| Title: | Properties of interface states at Ta2O5/n-Si interfaces. |
|---|---|
| Authors: | Zhang, S. K., Fu, Z. W., Ke, L. |
| Source: | Journal of Applied Physics; July 1 1998, Vol. 84 Issue 1, p335-338, 4p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500393548 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Properties of interface states at Ta2O5/n-Si interfaces. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Zhang%2C+S%2E+K%2E%22">Zhang, S. K.</searchLink><br /><searchLink fieldCode="AU" term="%22Fu%2C+Z%2E+W%2E%22">Fu, Z. W.</searchLink><br /><searchLink fieldCode="AU" term="%22Ke%2C+L%2E%22">Ke, L.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; July 1 1998, Vol. 84 Issue 1, p335-338, 4p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500393548 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/1.368032 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 4 StartPage: 335 Titles: – TitleFull: Properties of interface states at Ta2O5/n-Si interfaces. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Zhang, S. K. – PersonEntity: Name: NameFull: Fu, Z. W. – PersonEntity: Name: NameFull: Ke, L. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: July 1 1998 Type: published Y: 1998 Identifiers: – Type: issn-print Value: 00218979 Numbering: – Type: volume Value: 84 – Type: issue Value: 1 Titles: – TitleFull: Journal of Applied Physics Type: main |
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