Algebraic test-pattern generation based on the Reed-Muller spectrum.
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| Title: | Algebraic test-pattern generation based on the Reed-Muller spectrum. |
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| Authors: | Gil, C., Ortega, J. |
| Source: | IEE Proceedings -- Computers & Digital Techniques; July 1998, Vol. 145 Issue 4, p308-316, 9p |
| Database: | Applied Science & Technology Source |
| ISSN: | 13502387 |
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| DOI: | 10.1049/ip-cdt:19982024 |
