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Algebraic test-pattern generation based on the Reed-Muller spectrum.

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Title: Algebraic test-pattern generation based on the Reed-Muller spectrum.
Authors: Gil, C., Ortega, J.
Source: IEE Proceedings -- Computers & Digital Techniques; July 1998, Vol. 145 Issue 4, p308-316, 9p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 500395495
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PubType: Academic Journal
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        Value: 10.1049/ip-cdt:19982024
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      – Code: eng
        Text: English
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        PageCount: 9
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      – TitleFull: Algebraic test-pattern generation based on the Reed-Muller spectrum.
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              Text: July 1998
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              Y: 1998
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