Measurement of band offsets and interface charges by the C-V matching method.

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Bibliographic Details
Title: Measurement of band offsets and interface charges by the C-V matching method.
Authors: Nemirovsky, Y., Gordon, G., Goren, D.
Source: Journal of Applied Physics; July 15 1998, Vol. 84 Issue 2, p1113-1120, 8p
Database: Applied Science & Technology Source
Description
ISSN:00218979
DOI:10.1063/1.368111