Measurement of band offsets and interface charges by the C-V matching method.

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Title: Measurement of band offsets and interface charges by the C-V matching method.
Authors: Nemirovsky, Y., Gordon, G., Goren, D.
Source: Journal of Applied Physics; July 15 1998, Vol. 84 Issue 2, p1113-1120, 8p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500400951
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PubType: Academic Journal
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RecordInfo BibRecord:
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        Value: 10.1063/1.368111
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 1113
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      – TitleFull: Measurement of band offsets and interface charges by the C-V matching method.
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            NameFull: Nemirovsky, Y.
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            NameFull: Gordon, G.
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              Text: July 15 1998
              Type: published
              Y: 1998
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