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Ion milling damage and regrowth of oxide substrates studied by ion channeling and atomic force microscopy.

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Title: Ion milling damage and regrowth of oxide substrates studied by ion channeling and atomic force microscopy.
Authors: Takeuchi, I., Sharma, R. P., Choopun, S.
Source: Applied Physics Letters; June 9 1997, Vol. 70, p3098-3100, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500465817
AccessLevel: 2
PubType: Academic Journal
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  Data: Ion milling damage and regrowth of oxide substrates studied by ion channeling and atomic force microscopy.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; June 9 1997, Vol. 70, p3098-3100, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500465817
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.119103
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 3098
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      – TitleFull: Ion milling damage and regrowth of oxide substrates studied by ion channeling and atomic force microscopy.
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            NameFull: Takeuchi, I.
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            NameFull: Sharma, R. P.
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            NameFull: Choopun, S.
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            – D: 09
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              Text: June 9 1997
              Type: published
              Y: 1997
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              Value: 70
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