Interface properties of MOS structures on n-type 6H-SiC.

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Bibliographic Details
Title: Interface properties of MOS structures on n-type 6H-SiC.
Authors: Friedrichs, P., Burte, E. P., Schörner, R.
Source: Solid-State Electronics; July 1997, Vol. 41, p991-994, 4p
Database: Applied Science & Technology Source
Description
ISSN:00381101
DOI:10.1016/S0038-1101(97)00011-7