APA (7th ed.) Citation

Friedrichs, P., Burte, E. P., & Schörner, R. (1997). Interface properties of MOS structures on n-type 6H-SiC. Solid-State Electronics, 41, 991. https://doi.org/10.1016/S0038-1101(97)00011-7

Chicago Style (17th ed.) Citation

Friedrichs, P., E. P. Burte, and R. Schörner. "Interface Properties of MOS Structures on N-type 6H-SiC." Solid-State Electronics 41 (1997): 991. https://doi.org/10.1016/S0038-1101(97)00011-7.

MLA (9th ed.) Citation

Friedrichs, P., et al. "Interface Properties of MOS Structures on N-type 6H-SiC." Solid-State Electronics, vol. 41, 1997, p. 991, https://doi.org/10.1016/S0038-1101(97)00011-7.