View in EDS

Interface properties of MOS structures on n-type 6H-SiC.

Saved in:
Bibliographic Details
Title: Interface properties of MOS structures on n-type 6H-SiC.
Authors: Friedrichs, P., Burte, E. P., Schörner, R.
Source: Solid-State Electronics; July 1997, Vol. 41, p991-994, 4p
Database: Applied Science & Technology Source
Be the first to leave a comment!
You must be logged in first