Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis.
Saved in:
| Title: | Recordable depth of view and allowable farthest far-field distance of in-line far-field holography for micro-object analysis. |
|---|---|
| Authors: | Lai, Tianshu, Lin, Weizhu |
| Source: | Applied Optics; July 1 1997, Vol. 36, p4419-4424, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036935 |
|---|---|
| DOI: | 10.1364/AO.36.004419 |
