Statistical models for charge collection efficiency and variance in semiconductor spectrometers.
Saved in:
| Title: | Statistical models for charge collection efficiency and variance in semiconductor spectrometers. |
|---|---|
| Authors: | Ruzin, A., Nemirovsky, Y. |
| Source: | Journal of Applied Physics; September 15 1997, Vol. 82, p2754-2758, 5p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
|---|---|
| DOI: | 10.1063/1.366106 |
