Tip-sample distance feedback control in a scanning evanescent microwave microscope.
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| Title: | Tip-sample distance feedback control in a scanning evanescent microwave microscope. |
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| Authors: | Duewer, Fred, Gao, C., Takeuchi, I. |
| Source: | Applied Physics Letters; May 3 1999, Vol. 74 Issue 18, p2696-2698, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.123940 |
