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Tip-sample distance feedback control in a scanning evanescent microwave microscope.

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Bibliographic Details
Title: Tip-sample distance feedback control in a scanning evanescent microwave microscope.
Authors: Duewer, Fred, Gao, C., Takeuchi, I.
Source: Applied Physics Letters; May 3 1999, Vol. 74 Issue 18, p2696-2698, 3p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500531200
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PubType: Academic Journal
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1063/1.123940
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 2696
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      – TitleFull: Tip-sample distance feedback control in a scanning evanescent microwave microscope.
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          Name:
            NameFull: Duewer, Fred
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            NameFull: Gao, C.
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            NameFull: Takeuchi, I.
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            – D: 03
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              Text: May 3 1999
              Type: published
              Y: 1999
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