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Atomic force microscope based Kelvin probe measurements: application to an electrochemical reaction.

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Bibliographic Details
Title: Atomic force microscope based Kelvin probe measurements: application to an electrochemical reaction.
Authors: Böhmisch, M., Burmeister, F., Rettenberger, A.
Source: Journal of Physical Chemistry B.; December 4 1997, Vol. 101, p10162-10165, 4p
Database: Applied Science & Technology Source
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