Efficient approaches to low-cost high-fault coverage VLSI BIST designs.

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Bibliographic Details
Title: Efficient approaches to low-cost high-fault coverage VLSI BIST designs.
Authors: Chen, Chien-In Henry
Source: IEEE Transactions on Aerospace & Electronic Systems; January 1998, Vol. 34, p63-70, 8p
Database: Applied Science & Technology Source
Description
ISSN:00189251
DOI:10.1109/7.640263