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Efficient approaches to low-cost high-fault coverage VLSI BIST designs.

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Title: Efficient approaches to low-cost high-fault coverage VLSI BIST designs.
Authors: Chen, Chien-In Henry
Source: IEEE Transactions on Aerospace & Electronic Systems; January 1998, Vol. 34, p63-70, 8p
Database: Applied Science & Technology Source
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PubType: Academic Journal
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        Value: 10.1109/7.640263
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 63
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      – TitleFull: Efficient approaches to low-cost high-fault coverage VLSI BIST designs.
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            NameFull: Chen, Chien-In Henry
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              Text: January 1998
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              Y: 1998
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              Value: 34
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