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Real-time, interferometrically measuring atomic force microscope for direct calibration of standards.

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Bibliographic Details
Title: Real-time, interferometrically measuring atomic force microscope for direct calibration of standards.
Authors: Gonda, S., Doi, T., Kurosawa, T.
Source: Review of Scientific Instruments; August 1999, Vol. 70 Issue 8, p3362-3368, 7p
Database: Applied Science & Technology Source
Description
ISSN:00346748
DOI:10.1063/1.1149920