Gonda, S., Doi, T., & Kurosawa, T. (1999). Real-time, interferometrically measuring atomic force microscope for direct calibration of standards. Review of Scientific Instruments, 70(8), 3362. https://doi.org/10.1063/1.1149920
Chicago Style (17th ed.) CitationGonda, S., T. Doi, and T. Kurosawa. "Real-time, Interferometrically Measuring Atomic Force Microscope for Direct Calibration of Standards." Review of Scientific Instruments 70, no. 8 (1999): 3362. https://doi.org/10.1063/1.1149920.
MLA (9th ed.) CitationGonda, S., et al. "Real-time, Interferometrically Measuring Atomic Force Microscope for Direct Calibration of Standards." Review of Scientific Instruments, vol. 70, no. 8, 1999, p. 3362, https://doi.org/10.1063/1.1149920.
Warning: These citations may not always be 100% accurate.