Resonance enhancement of electronic Raman scattering from nitrogen defect levels in silicon carbide.
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| Title: | Resonance enhancement of electronic Raman scattering from nitrogen defect levels in silicon carbide. |
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| Authors: | Burton, J. C., Long, F. H., Ferguson, I. T. |
| Source: | Journal of Applied Physics; August 15 1999, Vol. 86 Issue 4, p2073-2077, 5p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 500570727 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Resonance enhancement of electronic Raman scattering from nitrogen defect levels in silicon carbide. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Burton%2C+J%2E+C%2E%22">Burton, J. C.</searchLink><br /><searchLink fieldCode="AU" term="%22Long%2C+F%2E+H%2E%22">Long, F. H.</searchLink><br /><searchLink fieldCode="AU" term="%22Ferguson%2C+I%2E+T%2E%22">Ferguson, I. T.</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Physics%22">Journal of Applied Physics</searchLink>; August 15 1999, Vol. 86 Issue 4, p2073-2077, 5p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500570727 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1063/1.371011 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 2073 Titles: – TitleFull: Resonance enhancement of electronic Raman scattering from nitrogen defect levels in silicon carbide. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Burton, J. C. – PersonEntity: Name: NameFull: Long, F. H. – PersonEntity: Name: NameFull: Ferguson, I. T. IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 08 Text: August 15 1999 Type: published Y: 1999 Identifiers: – Type: issn-print Value: 00218979 Numbering: – Type: volume Value: 86 – Type: issue Value: 4 Titles: – TitleFull: Journal of Applied Physics Type: main |
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