Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing.
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| Title: | Minimisation of power dissipation during test application in full-scan sequential circuits using primary input freezing. |
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| Authors: | Nicolici, N., Al-Hashimi, B. M., Williams, A. C. |
| Source: | IEE Proceedings -- Computers & Digital Techniques; September 2000, Vol. 147 Issue 5, p313-322, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 13502387 |
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| DOI: | 10.1049/ip-cdt:20000537 |
