A comparative study of radiation- and stress-induced leakage currents in thin gate oxides.
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| Title: | A comparative study of radiation- and stress-induced leakage currents in thin gate oxides. |
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| Authors: | Ang, C. H., Ling, C. H., Cheng, Z. Y. |
| Source: | Semiconductor Science & Technology; October 2000, Vol. 15 Issue 10, p961-964, 4p |
| Database: | Applied Science & Technology Source |
| ISSN: | 02681242 |
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