Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy.
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| Title: | Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy. |
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| Authors: | Magtoto, N. P., Niu, C., Ekstrom, B. M. |
| Source: | Applied Physics Letters; October 2 2000, Vol. 77 Issue 14, p2228-2230, 3p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00036951 |
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| DOI: | 10.1063/1.1313816 |
