View in EDS

Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy.

Saved in:
Bibliographic Details
Title: Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy.
Authors: Magtoto, N. P., Niu, C., Ekstrom, B. M.
Source: Applied Physics Letters; October 2 2000, Vol. 77 Issue 14, p2228-2230, 3p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 500638908
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Magtoto%2C+N%2E+P%2E%22">Magtoto, N. P.</searchLink><br /><searchLink fieldCode="AU" term="%22Niu%2C+C%2E%22">Niu, C.</searchLink><br /><searchLink fieldCode="AU" term="%22Ekstrom%2C+B%2E+M%2E%22">Ekstrom, B. M.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; October 2 2000, Vol. 77 Issue 14, p2228-2230, 3p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=500638908
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1063/1.1313816
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 3
        StartPage: 2228
    Titles:
      – TitleFull: Dielectric breakdown of ultrathin aluminum oxide films induced by scanning tunneling microscopy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Magtoto, N. P.
      – PersonEntity:
          Name:
            NameFull: Niu, C.
      – PersonEntity:
          Name:
            NameFull: Ekstrom, B. M.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 02
              M: 10
              Text: October 2 2000
              Type: published
              Y: 2000
          Identifiers:
            – Type: issn-print
              Value: 00036951
          Numbering:
            – Type: volume
              Value: 77
            – Type: issue
              Value: 14
          Titles:
            – TitleFull: Applied Physics Letters
              Type: main
ResultId 1